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IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ)
For rules and details of the IECQ visit
www.IECQ.org
IECQ Certificate n°:
L-IECQ RCJ 09.0001
CB Certificate n°:
RCJ-07T-01-01
Issue No.:
1
CERTIFICATE OF APPROVAL OF INDEPENDENT TESTING LABORATORY
(Incorporating the requirements of ISO/IEC 17025: 2005)
Status:
Superseded
Organization
IMV CORPORATION
Manufacturer Code:
XX YYY
at their place of work:
Test Laboratory Division
Nagoya Test Laboratory
106-1 Neura Ukigai Miyoshi-cho
Nishikamo-gun AICHI 470-0207
Country
Japan
Scope:
Environmental Test
IEC 60068-2-6, 27, 29, 64 for electronic components
Add document:
The organization, facilities and procedures at the above place of work are in compliance with the Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ), QC 001002-3 clause 2.4 and ISO/IEC 17025: 2005 for the testing of electronic components under the IECQ. The scope of the approval is defined in the approval document(s).
Certificate issued by the following
Supervising Inspectorate
:
Reliability Center for Electronic Components of Japan (RCJ)
Hanwabekkan Building 5F,
1-7-4 Shintomi, Chuo-ku,
Tokyo 104-0041
JAPAN
1. This certificate may only be reproduced in full.
2. This certificate is not transferable and remains the property of the issuing body.
3. The Status and authenticity of this certificate may be verified by visiting the
Official IECQ Website
.
Date of
expiration
:
2010/10/14
Issue date:
2008/12/19
Copyright © IEC-IECQ 2024 , Geneva Switzerland. All rights reserved.
This Certificate has intentionally NOT been printed as the Certificates are the property of the issuing CB.
For further information or to request a copy of a Certificate please contact the relative issuing CB.
http://www.iecq.org/membership/participating_countries/